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Journal Articles

3-45MeV/u ion beam dosimetry using thin film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*

Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12

https://doi.org/10.1016/j.radphyschem.2003.02.001
 Times Cited Count：2 Percentile：18.9(Chemistry, Physical)

Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm$$^{2}$$) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than $$pm$$5%(1$$sigma$$) including uncertainty in fluence measurement($$pm$$2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10 $$mu$$m, respectively.

Journal Articles

Application of thin film dosimeters for 3-45MeV/amu ion beams

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki

JAERI-Conf 2000-001, p.310 - 313, 2000/03

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-2000-001.pdf

no abstracts in English

Journal Articles

Dosimetry systems for characteristics study of thin film dosimeters, 4; Fluence measurement and LET characteristics study of film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki

JAERI-Review 99-025, TIARA Annual Report 1998, p.100 - 102, 1999/10

https://jopss.jaea.go.jp/pdfdata/JAERI-Review-99-025.pdf

no abstracts in English

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